MAP1200 Prioritizing serviceable events and visual symptoms for repair
Use this procedure if there is more than one serviceable event, visual symptom, or both needing repair.
MAP1200 Section-1
Procedure
Display the details of each problem and then use Table 1 to
prioritize their repair.
| Priority | Condition | Description |
|---|---|---|
| 1 | Problems found during an LIC code update process | The LIC code update process checks for code update errors and other serviceable events that occur during the process. If any are found, a new serviceable event is created that guides the repair process by calling a MAP4Axx isolation procedure. |
| 2 | CEC enclosure serviceable events | Both CEC enclosures need to be error free before repairing I/O enclosure or storage enclosure problems. This allows FRU verification FC-AL loop verify tests to complete properly. |
| 3 | The CEC enclosure control panel is not updating and is displaying a 2-character (xx) or 8-character (xxxxxxxx) code. | Go to MAP4360 Codes displayed by the CEC enclosure control panel. |
| 4 | The CEC enclosure control panel is not updating and is displaying something other than a 2-character (xx) or 8-character (xxxxxxxx) code. | Go to MAP4370 CEC enclosure control panel does not show a normal display. |
| 5 | I/O enclosure serviceable events | Both CEC enclosures need to be error free to do this repair. I/O enclosures need to be error free before repairing storage enclosure problems. This allows FRU verification FC-AL loop verify tests to complete properly. |
| 6 | PCIe (storage) serviceable events | Repair storage PCIe problems before individual SAS or PCIe storage enclosure drive problems. The FRUs for storage PCIe include:
Note: All CEC and I/O enclosures must be error free. This allows storage FRU verification tests
to complete properly.
|
| 7 | SAS (storage) serviceable events | Repair storage SAS problems before individual SAS storage enclosure drive
problems. The FRUs for storage SAS include:
Note: All CEC and I/O enclosures must be error free. This allows storage FRU verification tests
to complete properly.
|
| 8 | FC-AL serviceable events | FC-AL loops problems should be repaired before storage enclosure DDM problems.
The FRUs for the FC-AL loop are Device Adapter card, the FC-AL cable and the FC-IC card. It is
possible but not likely for a DDM to cause an FC-AL loop problem. Note: All CEC and I/O enclosures
must be error free. This allows FRU verification FC-AL loop verify tests to complete
properly.
|
| 9 | Storage enclosure serviceable events | Storage enclosure serviceable events are for the FCIC or storage enclosure backplane. The DDMs are listed in the next row in this table. |
| 10 | Storage enclosure DDM serviceable events | Storage enclosure DDM problems can be repaired anytime. After the DDM has been replaced, the DDM-certify process, which can take a long time, runs in the background so the service representative does not have to wait for it to finish. |
| 11 | Rack power and cooling system serviceable events | Power problems are normally be repaired after logic problems because of the fault tolerant design of the power system. |
| 12 | Multiple serviceable events for one fault | A single fault may create more than one related problem. The successful repair of one problem should close all related serviceable events. |
| 13 | Visual symptoms | Visual symptoms should create a related serviceable event. Repair related serviceable events before using visual symptoms. If there are no related serviceable events, go to MAP1320 Isolating problems using visual symptoms. |